-40%
ToF-SIMS (Time of Flight Secondary Ion Mass Spectrometer)
ToF-SIMS (Time of Flight Secondary Ion Mass Spectrometer)
ToF-SIMS (Time of Flight Secondary Ion Mass Spectrometer)
ToF-SIMS (Time of Flight Secondary Ion Mass Spectrometer)
ToF-SIMS (Time of Flight Secondary Ion Mass Spectrometer)

ToF-SIMS (Time of Flight Secondary Ion Mass Spectrometer)

$ 73920

Availability: 50 in stock
  • All returns accepted: ReturnsNotAccepted
  • Condition: Used
  • Type: Mass Spectrometer
  • Country/Region of Manufacture: United States
  • Brand: PHI
  • Model: PHI SIMS
  • Intended Use/Discipline: Physical Laboratory

    Description

    ToF-SIMS (Time of Flight Secondary Ion Mass Spectrometer).
    •
    Gaion primary beam source
    •
    Ar
    /O
    2
    gas sputter gun
    •
    Highmass resolution mass spectrum
    •
    Highlateral resolution elemental mapping
    •
    Highresolution depth profiling
    •
    Excellentworking condition
    Instrument Name:
    ToF
    -SIMS
    Manufacturer:
    PhysicalElectronics Inc (PHI)
    Model:
    TRIFT III
    ManufacturerYear:
    2000
    The buyer arranges pickup or is responsible for shipping